Abstract
This study presents the first use of high-angular resolution electron backscatter diffraction (HR-EBSD) to quantitatively characterise geometrically necessary dislocations in quartz subgrain structures. HR-EBSD exploits cross-correlation of diffraction patterns to measure intragranular misorientations with precision on the order of 0.01° with well-constrained misorientation axes. We investigate the dislocation structures of
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