Evaluation of image-based bias field correction at 7T

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van Rijssel, Mike; Pluim, JPW; van der Velden, Bas; van der Velden, Tijl; Krikken, E; Wijnen, Jannie; Gilhuijs, Kenneth; Klomp, DWJ

(2015) ESMRMB, pp. S316 - 7

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