Scanning Probe Microscopy and Spectroscopy

Liljeroth, Peter; Grandidier, B.; Delerue, Christophe; Vanmaekelbergh, Daniel

doi:https://doi.org/10.1007/978-3-662-44823-6_8

Scanning Probe Microscopy and Spectroscopy

DSpace/Manakin Repository

Scanning Probe Microscopy and Spectroscopy

Liljeroth, Peter; Grandidier, B.; Delerue, Christophe; Vanmaekelbergh, Daniel

(2014) Mello Donegá , Celso de (ed.), Nanoparticles, pp. 223 - 255

(Part of book)

Abstract

This chapter shows how scanning tunneling microscopy and spectroscopy and atomic force microscopy can be used to measure the properties of individual nanocrystals, thereby circumventing the limitations of ensemble based measurements.

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DOI: https://doi.org/10.1007/978-3-662-44823-6_8

ISBN: 978-3-662-44822-9
978-3-662-44823-6

Publisher: Springer

(Peer reviewed)

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