High-frequency EPR and ENDOR spectroscopy on semiconductor nanocrystals

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High-frequency EPR and ENDOR spectroscopy on semiconductor nanocrystals
 
Orlinski, S.B.; Blok, H.; Groenen, E.J.J.; Schmidt, J.; Baranov, P.G.; de Mello Donega, C.; Meijerink, A.
(2005) Magnetic Resonance in Chemistry, volume 43, pp. S140 - S144
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Keywords: International
ISSN: 1097-458X
Publisher: John Wiley and Sons Ltd
(Peer reviewed)
 
 
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