Atomic XAFS as a Tool to Probe the Electronic Properties of Supported Noble Metal Nanoclusters

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Atomic XAFS as a Tool to Probe the Electronic Properties of Supported Noble Metal Nanoclusters
 
van der Eerden, A.M.J.; Visser, M.H.; Nijhuis, T.A.; Ikeda, Y.; Lepage, M.; Koningsberger, D.C.
(2005) Journal of the American Chemical Society, volume 127, pp. 3272 - 3273
(Article)
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Keywords: International
ISSN: 0002-7863
Publisher: American Chemical Society
(Peer reviewed)
 
 
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