New visibility partitions with applications in affine pattern matching

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New visibility partitions with applications in affine pattern matching
 
Hagedoorn, M.; Overmars, M.H.; Veltkamp, R.C.
(1999) Utrecht University Repository
(Report)
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Keywords: Wiskunde en Informatica (WIIN), Ordered by external client
ISBN: 0924-3275
Publisher: Utrecht University: Information and Computing Sciences
 
 
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