Reliable and efficient pattern matching using an affine invariant metric

DSpace/Manakin Repository

Reliable and efficient pattern matching using an affine invariant metric
 
Hagedoorn, M.; Veltkamp, R.C.
(1997) Utrecht University Repository
(Report)
Download/Full Text
Open Access version via Utrecht University Repository Unknown
 
Keywords: Wiskunde en Informatica (WIIN), Ordered by external client
ISBN: 0924-3275
Publisher: Utrecht University: Information and Computing Sciences
 
 
See more statistics about this item