Generation recombination noise in reduced rutile (TiO2)

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Generation recombination noise in reduced rutile (TiO2)
 
Zijlstra, R.J.J.; Leeuwerik, F.J.; Kleinpenning, Th.G.M.
(1966) Physics Letters, volume 23, issue 3, pp. 185 - 186
(Article)
Abstract
Generation recombination noise was observed in reduced rutile doped with aluminum in the frequency range of 25 Hz – 40 kHz and at temperatures ranging from 77°K up to 300°K.
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ISSN: 0031-9163
Publisher: Elsevier
 
 
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